Ç¥ÁØÈ­ Âü¿©¾È³»

TTAÀÇ Ç¥ÁØÇöȲ

Ȩ > Ç¥ÁØÈ­ °³¿ä > TTAÀÇ Ç¥ÁØÇöȲ

Ç¥ÁعøÈ£ TTAK.KO-10.0566 ±¸Ç¥ÁعøÈ£
Á¦°³Á¤ÀÏ 2012-06-12 ÃÑÆäÀÌÁö 16
ÇѱÛÇ¥Áظí Ĩ ¼öÁØ EMC ÃøÁ¤À» À§ÇÑ ±ÙÀå ÇÁ·Îºê¿ë Å×½ºÆ® ÇȽºÃ³ ±¸Á¶
¿µ¹®Ç¥Áظí Test Fixture Structure of Near Field Probe for Measuring Chip-Level EMC
Çѱ۳»¿ë¿ä¾à ÁÖ¿ä ³»¿ëÀ¸·Î´Â ±ÙÀå ½ºÄ³´×(Scanning) ÇÁ·Îºê¸¦ º¸Á¤(Calibration)Çϱâ À§ÇØ »ç¿ëÇÏ´Â ¿øÇü Å×½ºÆ® ÇȽºÃ³(Test Fixture)¿¡ ´ëÇÑ »ç¾çÀ» ±ÔÁ¤ÇÏ°í ÀÖ´Ù.
¿µ¹®³»¿ë¿ä¾à The main content of this standard is to define the specifications of circular test fixture which is used for Near Field Scanning Probe calibration.
±¹Á¦Ç¥ÁØ
°ü·ÃÆÄÀÏ TTAK_KO-10_0566.pdf TTAK_KO-10_0566.pdf            

ÀÌÀü
¿Â½Àµµ ¼¾¼­ °è¼ö Ç¥½Ã ¹æ¹ý
´ÙÀ½
°³ÀÎ °Ç°­ ±â±â Åë½Å - ½ÉÇ÷°ü °Ç°­ ¹× È°µ¿ ¸ð´ÏÅÍ