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ÇѱÛÇ¥Áظí ICT Á¦Ç°ÀÇ Èñ¼Ò±Ý¼Ó Á¤¼º·Á¤·® ÃøÁ¤¹ý
¿µ¹®Ç¥Áظí Measurement Methods to Characterize Rare Metals in Information and Communication Technology Goods
Çѱ۳»¿ë¿ä¾à ICT Á¦Ç°Àº ´Ù¼öÀÇ ºÎÇ°°ú ¸ðµâ·Î ±¸¼ºµÇ¾î ÀÖÀ¸¸ç, ÀÌ·¯ÇÑ ºÎÇ°µéÀº ºñ±³Àû ¼Ò·®ÀÇ ÈñÀ¯±Ý¼Ó°ú ´Ù·®ÀÇ ÁÖ¿ä ¹°Áú(¿¹: ö, ºñö±Ý¼Ó, Çöó½ºÆ½, À¯¸® ¹× °ø¾÷¿ë ¼¼¶ó¹Í)·Î ÀÌ·ç¾îÁ® ÀÖ´Ù. ÀÌ·¯ÇÑ Á¦Ç°µéÀº ÀϹÝÀûÀ¸·Î º¹ÀâÇÑ »ý»ê °øÁ¤À» °ÅÃÄ Á¦Á¶µÈ´Ù. ÀçÈ°¿ë ½Ã½ºÅÛÀÇ ¼º°øÀûÀÎ ¿î¿µÀ» À§Çؼ­´Â, Á¦Á¶¾÷ü°¡ Á¤È®ÇÑ Èñ¼Ò±Ý¼Ó Á¤º¸¸¦ Á¦°øÇØ¾ß ÇÑ´Ù. ±×·¯³ª ´Ù¼öÀÇ ÃøÁ¤ ¹× Ư¼ºÈ­ ¹æ¹ýÀ» ÀÌ¿ëÇÏ¿© ICT Á¦Ç°ÀÇ ±¸¼º ¼ººÐÀÎ Èñ¼Ò±Ý¼Ó¿¡ °üÇÑ Á¤º¸¸¦ ÀÔ¼öÇÒ ¼ö ÀÖ´Ù. °¢°¢ÀÇ ¹æ¹ýÀº ±×·¯ÇÑ ¼ººÐ Á¤º¸ÀÇ ºÐ¼®¿¡ ÀÖ¾î Àú¸¶´ÙÀÇ ÀåÁ¡°ú ´ÜÁ¡ÀÌ ÀÖ´Ù.
¼ººÐ ºÐ¸® ±â´É°ú Á¤·®ÀûÀÎ ºÐ¼®Àº »ç¿ëµÇ´Â ÃøÁ¤ ¹æ¹ý¿¡ µû¶ó ´Þ¶óÁö¸ç Èñ¼Ò±Ý¼ÓÀÇ ¾ç°ú ÁúÀ» ±ÔÁ¤Çϴ ǥÁØÈ­µÈ ÃøÁ¤ ¹æ¹ýÀÌ ¾ø´Ù.
±×·¯³ª IEC 62321¿¡´Â ¹ÌÁöÀÇ ½Ã·á ¹× À¯ÇØ ¹°ÁúÀÇ Á¤·®/Á¤¼º ºÐ¼®À» ¼öÇàÇÏ´Â X¼± Çü±¤ ºÐ¼®(XRF) ¹× À¯µµ°áÇÕ ÇöóÁ Áú·® ºÐ¼®(ICP-MS) ÃøÁ¤ ¹æ¹ý¿¡ ´ëÇÑ ÀϺΠÁöħÀÌ Á¦°øµÇ¾î ÀÖ´Ù.
¿µ¹®³»¿ë¿ä¾à Smart factory reference model shows a general reference implementation of smart factory concept that describes common business actors, functional entities, and information interfaces by modeling the manufacturing industry. It is necessary to develop reference models appropriate for each manufacturing industry. This standard presents a smart factory reference model to apply smart factory technology to electronics components and assembly industry. This standards categorizes smart factory maturity into 4 levels and presents the requirements and reference manufacturing process models for each maturity level.
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