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Ç¥ÁعøÈ£ TTAS.OT-03.0008 ±¸Ç¥ÁعøÈ£
Á¦°³Á¤ÀÏ 2004-12-23 ÃÑÆäÀÌÁö 102
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¿µ¹®Ç¥Áظí Characteristics & Reliability Test Procedure for Laser Diode Chip/Module
Çѱ۳»¿ë¿ä¾à À¯µµ¹æÃâ¿¡ ÀÇÇØ ºûÀ» ÁõÆø½ÃÄÑ °£¼·¼ºÀÌ ¿ì¼öÇÑ ºûÀ» ¸¸µé¾îÁÖ´Â ·¹ÀÌÀú ´ÙÀÌ¿Àµå´Â ±¤ Åë½Å ºÐ¾ß¿¡ ÇÊ¿äÇÑ ÇÙ½É ºÎÇ°À¸·Î, ¸ðµâ ¹× ½Ã½ºÅÛ¿¡ ¿ä±¸µÇ´Â Ư¼º »Ó¸¸ ¾Æ´Ï¶ó ½Å·Ú¼ºÀÌ º¸ÀåµÇ¾î¾ß ÇÑ´Ù. ÀÌ¿¡ º» ¹®¼­´Â ±¹Á¦ Ç¥Áؼ­¸¦ ¹ÙÅÁÀ¸·Î ±¹³» ·¹ÀÌÀú ´ÙÀÌ¿ÀµåÀÇ Æ¯¼º ¹× ½Å·Ú¼º ½ÃÇè¿¡ ÀûÇÕÇϵµ·Ï °³¹ßµÇ¾ú´Ù.
¿µ¹®³»¿ë¿ä¾à In optical communications a laser diode is a key component that produces the coherent light output by amplification process due to stimulated emission. It needs a good performance and reliability for the module and system applications. This standard based on international standards covers the performance and reliability test for a laser diode.
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