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| Ç¥ÁعøÈ£ | TTAK.KO-06.0625 | ±¸Ç¥ÁعøÈ£ | |
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| Á¦°³Á¤ÀÏ | 2025-12-05 | ÃÑÆäÀÌÁö | 21 |
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| ¿µ¹®Ç¥Áظí | Measurement Method for Ultra-low Magnetic Fields Using Atomic Magnetometers | ||
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| ¿µ¹®³»¿ë¿ä¾à | This document specifies the configuration and procedures for measuring ultra-low magnetic fields, down to several hundred femtotesla(fT), using an atomic magnetometer. It defines requirements for evaluating sensor characteristics and quantifying external magnetic fields with high reliability and reproducibility over repeated scans in identical ambient field conditions.
The measurement system shall comprise a light source, vapor cell, three-axis coil system, magnetic shielding, optical detector, and signal processing unit. The procedure shall begin with applying a reference magnetic field to acquire the magnetometer output, from which the sensor gain is determined. The output noise spectrum shall be analyzed to evaluate magnetic sensitivity and characterize sensor performance. Using this characterization, external ultra-low magnetic fields—either applied or ambient—shall be measured in absolute units based on the sensor's calibrated gain and linear response. Repeated measurements under identical conditions shall confirm reproducibility and stability. To evaluate the minimum detectable field, the ambient magnetic field shall be suppressed, and a near-zero field condition(residual field ¡Â0.1 nT) shall be established at the system center. All results shall be documented using the standardized test report format in Annex I. |
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