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¿µ¹®Ç¥Áظí Test Methods for the Characterization of Oxide Semiconductor Thin Film Transistor
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¿µ¹®³»¿ë¿ä¾à This standard specifies the items for evaluation of oxide semiconductor TFT and
explains the meaning of each item. Also, this standard specifies the actual apparatus
and methods for the each item.
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°ü·ÃÆÄÀÏ TTAK.KO-10.0524.pdf TTAK.KO-10.0524.pdf            

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