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ÇѱÛÇ¥Áظí Àü·Â¹ÝµµÃ¼ Æ®·£Áö½ºÅÍÀÇ ´ÙÀ̳ª¹Í ¿Â-ÀúÇ× ÃøÁ¤ ¹æ¹ý
¿µ¹®Ç¥Áظí Measuring Method for Dynamic On-Resistance of Power Semiconductor Transistors
Çѱ۳»¿ë¿ä¾à º» Ç¥ÁØÀÇ ÁÖ¿ä ³»¿ëÀ¸·Î Ç¥ÁØ ³»¿¡¼­ »ç¿ëµÇ´Â ¿ë¾î¸¦ Á¤ÀÇÇÏ°í Àü·Â¹ÝµµÃ¼ Æ®·£Áö½ºÅÍÀÇ ´ÙÀ̳ª¹Í ¿Â-ÀúÇ׿¡ ´ëÇÑ ÃøÁ¤ ¹æ¹ýÀ» ¼³¸íÇÑ´Ù. Àü·Â¹ÝµµÃ¼ Æ®·£Áö½ºÅÍÀÇ ´ÙÀ̳ª¹Í ¿Â-ÀúÇ×Àº ½ºÀ§Äª ¼Õ½Ç°ú ¹ÐÁ¢ÇÑ °ü°è°¡ ÀÖ´Â °ÍÀ¸·Î º» Ç¥ÁØÀº Àü·Â¹ÝµµÃ¼ Æ®·£Áö½ºÅÍ Áß¿¡¼­ Si(Silicon, ½Ç¸®ÄÜ) ±â¹ÝÀÇ Àü·Â¹ÝµµÃ¼ Æ®·£Áö½ºÅÍ¿¡ ±¹ÇÑÇÏÁö ¾Ê°í GaN(Gallium Nitride, ÁúÈ­°¥·ý) ¹× SiC(Silicon Carbide, ½Ç¸®ÄÜ Ä«¹ÙÀ̵å) ±â¹ÝÀÇ Àü·Â¹ÝµµÃ¼ Æ®·£Áö½ºÅÍ¿¡µµ Àû¿ëÀÌ °¡´ÉÇÏ´Ù.
¿µ¹®³»¿ë¿ä¾à The standard includes the definition of the using terminologies and measuring parameters of the dynamic on-resistance of the power semiconductor transistors in order to compare performance with other power semiconductor transistors. It is also applicable to GaN and SiC-based power semiconductor transistors including Si-based power semiconductor transistors.
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