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Ç¥ÁعøÈ£ | TTAK.KO-10.0803 | ±¸Ç¥ÁعøÈ£ | |
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Á¦°³Á¤ÀÏ | 2015-10-13 | ÃÑÆäÀÌÁö | 21 |
ÇѱÛÇ¥Áظí | ¹ÝµµÃ¼ ¼ÒÀÚÀÇ 1/f ÀâÀ½ Æò°¡ ¹æ¹ý | ||
¿µ¹®Ç¥Áظí | Evaluation Method of 1/f Noise of Semiconductor Devices | ||
Çѱ۳»¿ë¿ä¾à | º» Ç¥ÁØÀº Á¤º¸ Åë½Å¿ë ¹ÝµµÃ¼ ȸ·Î³ª IoT(Internet of Things) µî¿¡ »ç¿ëµÇ´Â ´Ù¾çÇÑ ¹ÝµµÃ¼ ¼ÒÀÚ(semiconductor device)³ª ¼¾¼ÀÇ 1/f ÀâÀ½À» Á¤È®È÷ Æò°¡Çϱâ À§ÇÑ ¹æ¹ýÀ» ±ÔÁ¤ÇÑ´Ù. 1/f ÀâÀ½Àº ¹ÝµµÃ¼ ¼ÒÀÚ ¹× ¼¾¼ÀÇ ¾Æ³¯·Î±× ¼º´É¿¡ ¿µÇâÀ» ¹ÌÄ¡´Â ¸Å¿ì Áß¿äÇÑ ÆĶó¹ÌÅÍÀ̹ǷΠ1/f ÀâÀ½À» Á¤È®È÷ Æò°¡ÇÏ´Â °ÍÀÌ ÇÊ¿äÇϸç, º» Ç¥ÁØ¿¡¼´Â ÀÌ·¯ÇÑ 1/f ÀâÀ½À» Æò°¡ÇÏ´Â ¹æ¹ý¿¡ ´ëÇÏ¿© ±ÔÁ¤ÇÑ´Ù. | ||
¿µ¹®³»¿ë¿ä¾à | This standard specifies the measurement method for 1/f noise of various semiconductor devices and sensors that are used much to semiconductor circuits for telecommunications or IoTs(Internet of Things), etc. It is highly necessary to evaluate 1/f noise because 1/f noise is one of the key parameters, which influence in analog performance of semiconductor devices and sensors. This standard specifies the evaluation method for 1/f noise. | ||
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