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Ç¥ÁعøÈ£ | TTAK.KO-10.0691 | ±¸Ç¥ÁعøÈ£ | |
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Á¦°³Á¤ÀÏ | 2013-12-18 | ÃÑÆäÀÌÁö | 27 |
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¿µ¹®Ç¥Áظí | Measurement Method for Switching Response Time of Switching Devices | ||
Çѱ۳»¿ë¿ä¾à | º» Ç¥ÁØÀº ÁÖ¿ä ³»¿ëÀ¸·Î »ç¿ëµÇ´Â ¿ë¾î¸¦ Á¤ÀÇÇÏ°í ½ºÀ§Ä¡ ¼ÒÀÚÀÇ ½ºÀ§Äª ÀÀ´ä
½Ã°£¿¡ ´ëÇÑ ÃøÁ¤ ¹æ¹ýÀ» ¼³¸íÇÑ´Ù. º» Ç¥ÁØÀº ½ºÀ§Ä¡ ¼ÒÀÚ Áß¿¡¼ Àü°è È¿°ú Æ®·£Áö½ºÅÍ(Field Effect Transistor)¿¡ ±¹ÇÑÇÏ¿´À¸¸ç °øÇÌÇü(Depletion Mode ¶Ç´Â Normally-On) ½ºÀ§Ä¡ ¼ÒÀÚ¿Í Áõ°¡Çü(Enhancement Mode ¶Ç´Â Normally-Off) ½ºÀ§Ä¡ ¼ÒÀÚ¿¡ Àû¿ëÀÌ °¡´ÉÇÏ´Ù. |
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¿µ¹®³»¿ë¿ä¾à | This standard includes definition of the terms and measuring parameters of the
switching response time characteristics of switching devices in order to compare their performances and choose some switching devices. It is limited within the Field Effect Transistors including Normally-off and Normally-on switching devices. |
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°ü·ÃÆÄÀÏ | TTAK.KO-10.0691.pdf |
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- 항공 SW 형상 관리 지침