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Ç¥ÁعøÈ£ | TTAK.KO-10.0589 | ±¸Ç¥ÁعøÈ£ | |
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Á¦°³Á¤ÀÏ | 2012-10-09 | ÃÑÆäÀÌÁö | 16 |
ÇѱÛÇ¥Áظí | »êȹ° ¹ÝµµÃ¼ ¹Ú¸· Æ®·£Áö½ºÅÍÀÇ ½Å·Ú¼º¿¡ ´ëÇÑ ÃøÁ¤ ¹æ¹ý – Á¦2ºÎ: ȯ°æÀû Ư¼º | ||
¿µ¹®Ç¥Áظí | Test Methods for the Stability of Oxide Semiconductor Thin Film Transistor - Part 2: Environmental Characteristics | ||
Çѱ۳»¿ë¿ä¾à | »êȹ° ¹ÝµµÃ¼ ¹Ú¸· Æ®·£Áö½ºÅÍÀÇ »ç¿ë ȯ°æ¿¡ ´ëÇÑ ½Å·Ú¼º Æò°¡¿¡ ÇÊ¿äÇÑ Ç׸ñ¿¡ ´ëÇÏ¿© Á¤ÀÇÇÏ°í ÀÖÀ¸¸ç °¢ Ç׸ñÀÌ Áö´Ñ Àǹ̿¡ ´ëÇÏ¿© ¼³¸íÇÑ´Ù. ¶ÇÇÑ, °¢ Ç׸ñÀ» ½ÇÁ¦·Î ÃøÁ¤ÇÏ´Â µµ±¸ ¹× ¹æ¹ý¿¡ ´ëÇÏ¿© Á¤ÀÇÇÑ´Ù. | ||
¿µ¹®³»¿ë¿ä¾à | This standard specifies the evaluation items for evaluation for the environmental stability of oxide semiconductor TFT and explains the meaning of each item. Also, this standard defines the actual apparatus and methods for the each item. | ||
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