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Ç¥ÁعøÈ£ | TTAK.KO-10.0443 | ±¸Ç¥ÁعøÈ£ | |
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Á¦°³Á¤ÀÏ | 2010-12-23 | ÃÑÆäÀÌÁö | 0 |
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¿µ¹®Ç¥Áظí | Measurement Guideline for Output Power Characteristics Comparison of High Power Semiconductor Devices | ||
Çѱ۳»¿ë¿ä¾à | °íÃâ·Â ¹ÝµµÃ¼ ¼ÒÀÚ ¹× À̸¦ ÀÌ¿ëÇÑ ÁýÀûȸ·ÎÀÇ Ãâ·Â Àü·Â Ư¼ºÀ» ºñ±³Çϱâ À§ÇØ ÃøÁ¤ Á¶°ÇÀ» Ç¥ÁØÈÇÏ¿© »óÈ£ ºñ±³¸¦ ÇÏ°í À̸¦ ÅëÇØ ºÎÇ° ¼±Åðú ÆÇ´ÜÀ» Á¤È®È÷ Çϱâ À§ÇÔÀÌ´Ù. ƯÈ÷ °íÃâ·Â ¹ÝµµÃ¼ ¼ÒÀÚ ¹× ÁýÀûȸ·Î´Â °íÃâ·Â Ư¼ºÀ¸·Î ÀÎÇÏ¿© ¿ È¿°ú (Thermal Effect)·Î ÀÎÇÑ Àü·ù °¨¼Ò ¹× Ãâ·Â Àü·Â °¨¼Ò Çö»óÀÌ Àִµ¥, À̸¦ ¸·±â À§ÇØ ÀÔ·Â ½ÅÈ£ ¹× ¹ÙÀ̾¸¦ ÀÏÁ¤ ½Ã°£ µ¿¾È ÀÔ·ÂÇÏ¿© Æ®·£Áö½ºÅÍ°¡ ¿ÈµÇ´Â ½Ã°£À» °¨¼ÒÇÏ´Â ¹æ¹ýÀÎ ÆÞ½º ¸ðµå·Î ÃøÁ¤ÇÏ´Â ¹æ¹ýÀ» ¼±È£ÇÏ°í ÀÖ´Â »óȲÀÌ´Ù. ÀÌ¿Í °°Àº ÃøÁ¤ ¹æ¹ýÀÌ °íÃâ·Â ¹ÝµµÃ¼ ¼ÒÀÚ ¹× ÁýÀûȸ·ÎÀÇ Ãâ·ÂƯ¼ºÀ» °¡Àå Á¤È®È÷ ÃøÁ¤ÇÏ´Â ¹æ¹ýÀÌ´Ù. ±×·¯³ª ÆÞ½º ¸ðµå ÃøÁ¤ ¹æ¹ýÀº °èÃø±âÀÇ ¼º´É°ú ÃøÁ¤ ȯ°æÀÇ Â÷ÀÌ·Î ÀÎÇÏ¿© ÆÞ½ºÀÇ ±æÀÌ, ÆÞ½º °£°Ý µîÀÌ ÃµÂ÷¸¸º°À̸ç ÃøÁ¤ Á¶°ÇÀÌ Æ¯º°È÷ Á¤ÇØÁ® ÀÖÁö ¾Ê±â ¶§¹®¿¡ °¢ Á¦Ç°À» »ý»êÇϴ ȸ»ç¸¶´Ù ÃøÁ¤ Á¶°ÇÀÌ ´Ù¸£°í, ÀÌ ¶§¹®¿¡ ¼ÒÀÚ ¹× ÁýÀûȸ·ÎÀÇ Æ¯¼ºÀ» »óÈ£ ºñ±³ÇÏ¿© Á¦Ç°À» ¼±ÅÃÇØ¾ß ÇÒ °æ¿ì, Á¤È®ÇÑ ÆÇ´ÜÀ» Çϱ⠾î·Á¿î °Ô Çö½ÇÀÌ´Ù. ÀÌ·¯ÇÑ ¹®Á¦Á¡À» ÇØ°áÇϱâ À§ÇØ ¿¬¼ÓÆÄ(CW: Continuous Wave) ¸ðµå ÃøÁ¤ ¹æ¹ýÀÎ Æò±Õ Àü·Â ÃøÁ¤ ¹æ¹ýÀ¸·Î ÃøÁ¤ÇÑ µ¥ÀÌÅ͸¦ ±Ô°Ý¼¿¡ Ãß°¡ÇÔÀ¸·Î½á »ç¿ëÀÚ°¡ Á¦Ç°µéÀ» »óÈ£ ºñ±³ÇÏ°í ¼±ÅÃÇÒ ¼ö ÀÖµµ·Ï º» Ç¥ÁØÀ» ÅëÇؼ ÃøÁ¤ ¹æ¹ýÀÇ °¡ÀÌµå ¶óÀÎÀ» Á¦°øÇÏ°íÀÚ ÇÑ´Ù. | ||
¿µ¹®³»¿ë¿ä¾à | One purpose of this standard is to standardize output power data in datasheets of products and measurement methods to compare output power characteristics of semiconductor devices. Eventually this standard is to select the right wanted product from measured data by the same measurement conditions. And another purpose is to use for output power comparison between their performances of some papers, products, etc.
Pulsed measurements can extend to regions outside the safe operation area without stressing or damaging the device. If the pulses are sufficiently short, there is no permanent change in the characteristic curves. With pulses, the range of the measured characteristic curves can often extend to encompass completely the signal excursions experienced during the large-signal operation of devices. Pulsed measurements are used to acquire characteristic curves that are free of dispersion effects. However, the pulse widths and pulse durations of pulse measurements are very different in datasheets of products. On the other hand, average power measurements are very simple methods comparing with pulse measurements. Therefore, average power measurements are to select the right wanted product from measured data by the same measurement conditions and to use for output power comparison between their performances of some papers, products, etc. |
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