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Ç¥ÁعøÈ£ TTAK.OT-10.0308 ±¸Ç¥ÁعøÈ£
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ÇѱÛÇ¥ÁØ¸í ³»ÀåÇü Äھ À§ÇÑ Å×½ºÆ® ·ÎÁ÷
¿µ¹®Ç¥Áظí Test Logic for Embedded Cores
Çѱ۳»¿ë¿ä¾à º» Ç¥ÁØÀº ½Ã½ºÅÛ ¿Â Ĩ¿¡¼­ ³»ÀåÇü ÄÚ¾îÀÇ Å×½ºÆ®¸¦ À§ÇÑ Å×½ºÆ® ·ÎÁ÷ ¹× ±× ±¸¼º ¿ä
¼Ò¸¦ ³»ÀåÇü ÄÚ¾î Å×½ºÆ® ¾ÆÅ°ÅØÃÄ, ¸í·É¾î, WSP, WPP, WIR, WBY, WBRÀÇ 7°³ Ç׸ñÀ¸
·Î ³ª´©¾î ±ÔÁ¤ÇÑ´Ù.
¿µ¹®³»¿ë¿ä¾à This standard specifies the test logic and its elements of embedded cores in
system- on- chip with 7 parts, i.e. embedded core test architecture, instructions,
WSP, WPP, WIR, WBY, and WBR.
±¹Á¦Ç¥ÁØ IEEE Std 1500-2005
°ü·ÃÆÄÀÏ TTAK.OT-10.0308.pdf TTAK.OT-10.0308.pdf            

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