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Ç¥ÁعøÈ£ | TTAK.KO-10.0486 | ±¸Ç¥ÁعøÈ£ | |
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Á¦°³Á¤ÀÏ | 2011-09-28 | ÃÑÆäÀÌÁö | 20 |
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¿µ¹®Ç¥Áظí | An electrical characterization method on a wafer in a capacitive MEMS microphone | ||
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¿µ¹®³»¿ë¿ä¾à | This standard specifies a basic standard of an electrical characterization process on
a wafer in a capacitive MEMS microphone. As a capacitive MEMS sensor is equipped with ROIC, which transforms a mechanical signal into an electrical signal. So, ahead of the connection between the sensor part and ROIC, an electrical characterization for the sensor part has to be exactly evaluated in order to be linked the ROIC module without being deteriorated on the output voltage. Thus, this standard secures mutual linkages of international standards and group standards. |
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°ü·ÃÆÄÀÏ | TTAK.KO-10.0486.zip |