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ÇѱÛÇ¥Áظí Ĩ ¼öÁØ EMC ÃøÁ¤À» À§ÇÑ ½ºÄ³³Ê
¿µ¹®Ç¥Áظí Scanner for Measuring Chip Level EMC
Çѱ۳»¿ë¿ä¾à º» Ç¥ÁØÀº Ĩ ¼öÁØ EMC ÃøÁ¤À» À§ÇÑ ±ÙÁ¢Àå ½ºÄµ ¹æ½Ä¿¡¼­ »ç¿ëµÉ ½ºÄ³³ÊÀÇ »ç¾çÀ» ±ÔÁ¤Çϰí ÀÖ´Ù.
¿µ¹®³»¿ë¿ä¾à The specification of scanner for the near field is defined.
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