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Ç¥ÁعøÈ£ | TTAK.KO-10.0449 | ±¸Ç¥ÁعøÈ£ | |
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Á¦°³Á¤ÀÏ | 2010-12-23 | ÃÑÆäÀÌÁö | 0 |
ÇѱÛÇ¥Áظí | Á¤Àü¿ë·®Çü MEMS ¸¶ÀÌÅ©·ÎÆùÀÇ ÆÐÅ°Áö¿¡ ´ëÇÑ ¿Àû º¯Çü Ư¼º Æò°¡ ¹æ¹ý | ||
¿µ¹®Ç¥Áظí | A characterization method for a thermal deformation at a package in a capacitive MEMS microphone | ||
Çѱ۳»¿ë¿ä¾à | Á¤Àü ¿ë·®Çü ¸â½º ¸¶ÀÌÅ©·ÎÆùÀº Å©°Ô ¿ÜºÎ À½¾Ð¿¡ ¹ÝÀÀÇÏ¿© ¹°¸®Àû ½ÅÈ£¸¦ Àü±âÀû ½ÅÈ£·Î º¯È¯ ÇØÁÖ´Â ¼¾¼ ºÎºÐ°ú À½Çâ ¼¾¼¿¡¼ ¹ß»ýµÇ´Â ³ôÀº Ãâ·Â ÀÓÇÇ´ø½º ½ÅÈ£¸¦ ó¸®ÇÏ´Â Æǵ¶ ÁýÀûȸ·Î (ROIC: Readout integrated circuits) ºÎºÐÀ¸·Î ±¸¼ºµÈ´Ù. °¢°¢ÀÇ ¸ðµâÀº ÆÐŰ¡ °øÁ¤À» ÅëÇØ ÀÏüȰ¡ µÇ¸ç ÀÌ·¯ÇÑ °øÁ¤Àº °í¿Â¿¡¼ ¿À» °¡ÇØÁÖ´Â ¿ÍÀÌ¾î º»µù ¹× ´Ù¾çÇÑ Á¢Âø ´Ü°è¸¦ ¼ö¹ÝÇÏ°Ô µÈ´Ù. º» Ç¥ÁØÀº ÆÐŰ¡ °øÁ¤¿¡ µû¸¥ Á¤Àü ¿ë·®Çü ¸â½º ¸¶ÀÌÅ©·ÎÆùÀÇ ¿Àû Æò°¡ ÀýÂ÷¿¡ ´ëÇÑ ±âº» ±Ô°Ý ¹× ¼¼ºÎ ³»¿ë¿¡ ´ëÇÏ¿© Á¤ÀÇÇÏ°í ÀÖÀ¸¸ç, °¢°¢ÀÇ ±â´É°ú ¹°¸®ÀûÀÎ »ç¾ç¿¡ ´ëÇÏ¿© Á¤ÀÇÇÑ´Ù. ¶ÇÇÑ ±¹Á¦ Ç¥ÁØ ¹× ´Üü ±Ô°Ý µî°ú ȣȯ °¡´ÉÇϵµ·Ï Á¤ÀÇÇÏ¿© »óÈ£ ¿¬µ¿¼ºÀ» º¸ÀåÇÑ´Ù. | ||
¿µ¹®³»¿ë¿ä¾à | This standard specifies a basic standard of a test process of a thermal characterization for packaging in a capacitive MEMS microphone. The test process is composed of packaging steps and thermal characterization steps. This standard secures mutual linkages of international standards and group standards. | ||
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°ü·ÃÆÄÀÏ | TTAK.KO-10.0449.zip |