Ȩ > Ç¥ÁØÈ °³¿ä > TTAÀÇ Ç¥ÁØÇöȲ
Ç¥ÁعøÈ£ | TTAK.OT-10.0308 | ±¸Ç¥ÁعøÈ£ | |
---|---|---|---|
Á¦°³Á¤ÀÏ | 2011-09-28 | ÃÑÆäÀÌÁö | 46 |
ÇѱÛÇ¥Áظí | ³»ÀåÇü Äھ À§ÇÑ Å×½ºÆ® ·ÎÁ÷ | ||
¿µ¹®Ç¥Áظí | Test Logic for Embedded Cores | ||
Çѱ۳»¿ë¿ä¾à | º» Ç¥ÁØÀº ½Ã½ºÅÛ ¿Â Ĩ¿¡¼ ³»ÀåÇü ÄÚ¾îÀÇ Å×½ºÆ®¸¦ À§ÇÑ Å×½ºÆ® ·ÎÁ÷ ¹× ±× ±¸¼º ¿ä
¼Ò¸¦ ³»ÀåÇü ÄÚ¾î Å×½ºÆ® ¾ÆÅ°ÅØÃÄ, ¸í·É¾î, WSP, WPP, WIR, WBY, WBRÀÇ 7°³ Ç׸ñÀ¸ ·Î ³ª´©¾î ±ÔÁ¤ÇÑ´Ù. |
||
¿µ¹®³»¿ë¿ä¾à | This standard specifies the test logic and its elements of embedded cores in
system- on- chip with 7 parts, i.e. embedded core test architecture, instructions, WSP, WPP, WIR, WBY, and WBR. |
||
±¹Á¦Ç¥ÁØ | IEEE Std 1500-2005 | ||
°ü·ÃÆÄÀÏ |
![]() |
- ÀÌÀü
- ÀüÀÚÃ¥EPUB ÃâÆǹ° 3.0
- ´ÙÀ½
- ÀüÀÚÃ¥EPUB 3 °³¿ä