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Ç¥ÁعøÈ£ TTAK.KO-10.0691 ±¸Ç¥ÁعøÈ£
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¿µ¹®Ç¥Áظí Measurement Method for Switching Response Time of Switching Devices
Çѱ۳»¿ë¿ä¾à º» Ç¥ÁØÀº ÁÖ¿ä ³»¿ëÀ¸·Î »ç¿ëµÇ´Â ¿ë¾î¸¦ Á¤ÀÇÇÏ°í ½ºÀ§Ä¡ ¼ÒÀÚÀÇ ½ºÀ§Äª ÀÀ´ä
½Ã°£¿¡ ´ëÇÑ ÃøÁ¤ ¹æ¹ýÀ» ¼³¸íÇÑ´Ù. º» Ç¥ÁØÀº ½ºÀ§Ä¡ ¼ÒÀÚ Áß¿¡¼­ Àü°è È¿°ú
Æ®·£Áö½ºÅÍ(Field Effect Transistor)¿¡ ±¹ÇÑÇÏ¿´À¸¸ç °øÇÌÇü(Depletion Mode ¶Ç´Â
Normally-On) ½ºÀ§Ä¡ ¼ÒÀÚ¿Í Áõ°¡Çü(Enhancement Mode ¶Ç´Â Normally-Off) ½ºÀ§Ä¡
¼ÒÀÚ¿¡ Àû¿ëÀÌ °¡´ÉÇÏ´Ù.
¿µ¹®³»¿ë¿ä¾à This standard includes definition of the terms and measuring parameters of the
switching response time characteristics of switching devices in order to compare their
performances and choose some switching devices. It is limited within the Field Effect
Transistors including Normally-off and Normally-on switching devices.
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°ü·ÃÆÄÀÏ TTAK.KO-10.0691.pdf TTAK.KO-10.0691.pdf            

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