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ÇѱÛÇ¥ÁØ¸í µðÁöÅÐ À§»ó À̹ÌÁöÀÇ À§»ó ¿À·ù ÃøÁ¤ ôµµ
¿µ¹®Ç¥Áظí Phase Error Measurement Metric of Digital Phase Images
Çѱ۳»¿ë¿ä¾à ÀÌ Ç¥ÁØÀº Ȧ·Î±×·¡ÇÇ, ¸¶ÀÌÅ©·Î½ºÄÚÇÇ, Åä¸ð±×·¡ÇÇ µî ´Ù¾çÇÑ ºÐ¾ß¿¡¼­ ¾²ÀÌ´Â ÁÖ±âÀûÀΠƯ¼ºÀ» °¡Áö´Â À§»ó Á¤º¸¿¡ ´ëÇÑ ¿À·ù ÃøÁ¤ ôµµ¸¦ Á¤ÀÇÇÑ´Ù. À§»ó Á¤º¸´Â 0~2¥ð »çÀÌÀÇ ¹üÀ§ ³»¿¡¼­ ÁÖ±âÀûÀ¸·Î ¹Ù²î¸é¼­ È°¿ë ºÐ¾ß¿¡ µû¶ó À§Ä¡³ª ½Ã°£ÀÇ Â÷¸¦ ³ªÅ¸³½´Ù. À§»ó Á¤º¸ÀÇ Ç¥ÇöÀ» 0~2¥ð·Î ÇÑÁ¤ÇÏ´Â °æ¿ì¿¡ ´ëÇØ À§»ó Á¤º¸´Â ±× ÁÖ±âÀûÀΠƯ¼º ¶§¹®¿¡ ÃÖ´ë ¿À·ù´Â ¥ð¸¦ ³ÑÀ» ¼ö ¾ø´Ù. ÀÌ·¯ÇÑ Æ¯¼ºÀ» °í·ÁÇÏ¿© À§»ó¿¡ ´ëÇÑ ¿À·ù´Â ±âÁ¸ µ¥ÀÌÅÍ¿Í ´Ù¸£°Ô Á¤Àǵǰí ÃøÁ¤µÇ¾î¾ß ÇÑ´Ù. À̸¦ ÅëÇØ À§»ó Á¤º¸¿¡ ´ëÇÑ ´Ù¾çÇÑ ½Åȣó¸® °üÁ¡¿¡¼­ÀÇ ÃÖÀûÈ­ ¹®Á¦¸¦ º¸´Ù È¿°úÀûÀ¸·Î Ç® ¼ö ÀÖ´Ù.
¿µ¹®³»¿ë¿ä¾à This standard defines an error measurement scale for phase information having periodic characteristics used in various fields such as holography, microscopy, and tomography.
The phase information periodically changes within a range between 0 and 2¥ð, indicating a difference in position or time depending on the application field. For the case where the expression of the phase information is limited to 0 to 2¥ð, the phase information has periodic characteristics, so that the maximum error for error measurement cannot exceed ¥ð. Considering these characteristics, the phase error should be defined and measured differently from the existing data. Through this, it is possible to solve the optimization problem in terms of various signal processing for phase information more effectively.
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°ü·ÃÆÄÀÏ TTAK.KO-10.1261.pdf TTAK.KO-10.1261.pdf            

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