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ÇѱÛÇ¥Áظí Ĩ ¼öÁØ EMC ÃøÁ¤À» À§ÇÑ ±ÙÀåÇÁ·Îºê º¸Á¤¹æ¹ý
¿µ¹®Ç¥Áظí Calibration Method of Near Field Probe for Measuring Chip Level EMC
Çѱ۳»¿ë¿ä¾à º» Ç¥ÁØÀº Ĩ ¼öÁØ EMC ÃøÁ¤À» À§ÇÑ ±ÙÁ¢Àå ÇÁ·Îºê¸¦ º¸Á¤(calibration)Çϱâ À§ÇØ »ç¿ëµÇ´Â Å×½ºÆ® ÀåÄ¡¿¡ ´ëÇÏ¿© ±× ¸ð¾çÀ» ¿øÇüÀ¸·Î »ç¿ëÇÏ´Â ¹æ¹ý¿¡ ´ëÇÑ °ÍÀÌ´Ù.
¿µ¹®³»¿ë¿ä¾à The method of calibrating near field probe using test fixture is defined to the scope of circle.
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