Ç¥ÁØÈ­ Âü¿©¾È³»

TTAÀÇ Ç¥ÁØÇöȲ

Ȩ > Ç¥ÁØÈ­ °³¿ä > TTAÀÇ Ç¥ÁØÇöȲ

Ç¥ÁعøÈ£ TTAK.KO-10.0559 ±¸Ç¥ÁعøÈ£
Á¦°³Á¤ÀÏ 2012-06-12 ÃÑÆäÀÌÁö 15
ÇѱÛÇ¥Áظí Ĩ ¼öÁØ EMC ÃøÁ¤À» À§ÇÑ ±ÙÀå ½ºÄ³³Ê¿ë ÇÁ·Îºê¿Í FBGA ±¸Á¶
¿µ¹®Ç¥Áظí The Distance between FBGA and Near Field Scanning Probe for Measuring Chip-Level EMC
Çѱ۳»¿ë¿ä¾à ÁÖ¿ä ³»¿ëÀ¸·Î´Â Ĩ ¼öÁØ EMC ÃøÁ¤ ½Ã ±ÙÀå ÇÁ·Îºê¿Í FBGA »çÀÌÀÇ °Å¸® »ç¾çÀ» ±ÔÁ¤ÇÏ°í ÀÖ´Ù.
¿µ¹®³»¿ë¿ä¾à The main content of this standard is to define the distance between FBGA and Near Field probe when measuring EMC for chip level.
±¹Á¦Ç¥ÁØ
°ü·ÃÆÄÀÏ TTAK_KO-10_0559.pdf TTAK_KO-10_0559.pdf            

ÀÌÀü
HTML5 ±â¹Ý ¼Ò¼È °ÔÀÓ ÇÁ·¹ÀÓ¿öÅ©
´ÙÀ½
¿þ¾î·¯ºí ÄÜÅÙÃ÷ ½Ãû ¾ÈÀü Áöħ