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Ç¥ÁعøÈ£ TTAK.KO-10.0803 ±¸Ç¥ÁعøÈ£
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ÇѱÛÇ¥ÁØ¸í ¹ÝµµÃ¼ ¼ÒÀÚÀÇ 1/f ÀâÀ½ Æò°¡ ¹æ¹ý
¿µ¹®Ç¥Áظí Evaluation Method of 1/f Noise of Semiconductor Devices
Çѱ۳»¿ë¿ä¾à º» Ç¥ÁØÀº Á¤º¸ Åë½Å¿ë ¹ÝµµÃ¼ ȸ·Î³ª IoT(Internet of Things) µî¿¡ »ç¿ëµÇ´Â ´Ù¾çÇÑ ¹ÝµµÃ¼ ¼ÒÀÚ(semiconductor device)³ª ¼¾¼­ÀÇ 1/f ÀâÀ½À» Á¤È®È÷ Æò°¡Çϱâ À§ÇÑ ¹æ¹ýÀ» ±ÔÁ¤ÇÑ´Ù. 1/f ÀâÀ½Àº ¹ÝµµÃ¼ ¼ÒÀÚ ¹× ¼¾¼­ÀÇ ¾Æ³¯·Î±× ¼º´É¿¡ ¿µÇâÀ» ¹ÌÄ¡´Â ¸Å¿ì Áß¿äÇÑ ÆĶó¹ÌÅÍÀ̹ǷΠ1/f ÀâÀ½À» Á¤È®È÷ Æò°¡ÇÏ´Â °ÍÀÌ ÇÊ¿äÇϸç, º» Ç¥ÁØ¿¡¼­´Â ÀÌ·¯ÇÑ 1/f ÀâÀ½À» Æò°¡ÇÏ´Â ¹æ¹ý¿¡ ´ëÇÏ¿© ±ÔÁ¤ÇÑ´Ù.
¿µ¹®³»¿ë¿ä¾à This standard specifies the measurement method for 1/f noise of various semiconductor devices and sensors that are used much to semiconductor circuits for telecommunications or IoTs(Internet of Things), etc. It is highly necessary to evaluate 1/f noise because 1/f noise is one of the key parameters, which influence in analog performance of semiconductor devices and sensors. This standard specifies the evaluation method for 1/f noise.
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