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¿µ¹®Ç¥Áظí Test Methods for the Stability of Oxide Semiconductor Thin Film Transistor - Part 1: Photo-Electrical Characteristics
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¿µ¹®³»¿ë¿ä¾à This standard defines the evaluation items for evaluation for the stability of oxide semiconductor TFT under photo-electrical stress and explains the meaning of each item. Also, this standard defines the actual apparatus and methods for the each item.
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