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Ç¥ÁØÁ¾·ù | Á¤º¸Åë½Å´ÜüǥÁØ(TTAS) | ||||||||||||||||
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Ç¥ÁعøÈ£ | TTAK.KO-10.1228 | ±¸ Ç¥ÁعøÈ£ | |||||||||||||||
Á¦°³Á¤ÀÏ | 2020-12-10 | ÃÑ ÆäÀÌÁö | 20 | ||||||||||||||
ÇÑ±Û Ç¥Áظí | µ¿À§¿ø¼ÒÀüÁö¿ë ¹ÝµµÃ¼ Èí¼öü Àü±âÀû Ư¼º ÃøÁ¤ ¹æ¹ý | ||||||||||||||||
¿µ¹® Ç¥Áظí | Method for Measuring Electrical Characteristics of SiC Semiconductor for Isotope Battery | ||||||||||||||||
ÇÑ±Û ³»¿ë¿ä¾à | ÀÌ Ç¥ÁØÀº µ¿À§¿ø¼ÒÀüÁö¿ë ¹ÝµµÃ¼ Èí¼öüÀÇ Àü±âÀû Ư¼ºÀ» Æò°¡ÇÏ´Â µ¥ Àû¿ëµÈ´Ù. ƯÈ÷ ¹èÅ͸®ÀÇ ±³Ã¼ ¶Ç´Â ÃæÀü¿¡ µû¸¥ ºÒÆíÇÔ°ú Á¦¾àÀÌ ÀÖ´Â ±âÁ¸ ÀüÁöÀÇ ÇѰ踦 ±Øº¹ÇÏ°í ÀúÀü·Â »ç¿ë±¸°£¿¡¼ ³ôÀº Àü·Â¹Ðµµ¸¦ °¡Áö´Â Â÷¼¼´ë ÀüÁö·Î¼ ¼ö¸íÀÌ ¹æ»ç¼º µ¿À§¿ø¼ÒÀÇ ¹Ý°¨±â¿¡ ºñ·ÊÇÏ¿© 10³â ÀÌ»óÀÇ Àå¼ö¸íÀÌ°í ³ôÀº ¿¡³ÊÁö ÀúÀå¹Ðµµ¸¦ °®´Â ¼Ò·®ÀÇ ¹«ÇØÇÑ º£Å¸¼±(¥â) ¼Ò½º¿Í ¿¬°áÇÏ¿© ¹Ý¿µ±¸ÀûÀÎ ÀüÁö¿¡ ÇØ´çµÈ´Ù. | ||||||||||||||||
¿µ¹® ³»¿ë¿ä¾à | This standard is applied to evaluate the electrical properties of semiconductor absorbers for isotope cells. In particular, it is a next-generation battery that overcomes the limitations of existing batteries with inconvenience and limitations due to replacement or charging of the battery, and has a high power density in a low-power use section, with a lifespan of 10 years or longer and high energy in proportion to the half-life of radioactive isotopes. It corresponds to a semi-permanent battery by connecting with a small amount of harmless beta-ray (¥â) source having a storage density. | ||||||||||||||||
°ü·Ã IPR È®¾à¼ | Á¢¼öµÈ IPR È®¾à¼ ¾øÀ½ | ||||||||||||||||
°ü·ÃÆÄÀÏ | TTAK.KO-10.1228.pdf | ||||||||||||||||
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