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Ç¥ÁعøÈ£ | TTAR-10.0062 | ±¸ Ç¥ÁعøÈ£ | |||||||||||||||
Á¦°³Á¤ÀÏ | 2016-11-03 | ÃÑ ÆäÀÌÁö | 0 | ||||||||||||||
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¿µ¹® Ç¥Áظí | Procedure of Self-Diagnosis for High-Speed Serial Interfaces (Technical report) | ||||||||||||||||
ÇÑ±Û ³»¿ë¿ä¾à | ÀÌ ±â¼úº¸°í¼´Â ¹ÝµµÃ¼ Ĩ°£ÀÇ µ¥ÀÌÅÍ Àü¼ÛƯ¼ºÀÇ ½Å·Ú¼ºÀ» ¿ÜºÎ °èÃø±âÀÇ µµ¿ò ¾øÀÌ ½º½º·Î Áø´ÜÇÏ´Â ÀýÂ÷¿¡ °üÇÑ °ÍÀÌ´Ù. Á¤»óµ¿ÀÛ¹üÀ§¿¡¼ ¸î ½Ã°£ÀÌ °É¸®´Â ¼ö½Å´ÜÀÇ ½Å·Ú¼ºÆò°¡¸¦ ¼ö½Å±â ³»ºÎ¿¡¼ °¡¼Ó½ÃÇèÀ» À§ÇØ »ùÇøµ½Ã°£ ½Ã°£À̳ª Àü¾ÐÀ» ÀÎÀ§ÀûÀ¸·Î ¿Ö°î½Ãų ¼ö ÀÖ´Â ±â´ÉÀ» ±¸ºñÇÏ¿© ¼ö ÃÊ À̳»¿¡ ½Å·Ú¼º Æò°¡¸¦ ¼öÇàÇϰí Åë°èÀû È®ÀåÀ» ÅëÇØ Á¤»óµ¿ÀÛÁ¶°Ç¿¡¼ ½Å·Ú¼ºÀ» °ËÁõÇÏ´Â ±Ô°Ý°ú ÀýÂ÷¿¡ °üÇÑ ³»¿ëÀÌ´Ù. | ||||||||||||||||
¿µ¹® ³»¿ë¿ä¾à | The technical report is to a self-diagnosis procedure for the reliability of the data transmission characteristic between the semiconductor chip without the aid of external measuring instruments. A reliability evaluation of a receiving end a few hours it takes in the normal operation range in the internal receiver to the acceleration test sampling time period or the voltage artificially performs functional reliability assessment within seconds by having that can distort and normal operation through statistical expansion the information on the standards and procedures to verify the authenticity in the condition. | ||||||||||||||||
°ü·Ã IPR È®¾à¼ | Á¢¼öµÈ IPR È®¾à¼ ¾øÀ½ | ||||||||||||||||
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